電路設計、測試、與除錯

臺北科技大學 115-1 學期課程，課號 361160。

• 學期：115-1
• 授課教師：李明哲
• 學分：3
• 選修
• 上課時段：週三 5、6、7 節

課程大綱

1.Using ADFT 16nm FinFET and/or CIC18 with EDA tools 2.Introduction to Testing 3.Digital Testing 4.Memory Testing 5.DAC Testing and/or ADC Testing

課程進度

week 1 Course Introduction week 2-4 Introduction to Testing week 5-8 Digital Testing week 9 Mid-term exam or Mid-term project week 10-12 Memory Testing week 13-17 DAC Testing and/or ADC Testing week 18 Final exam or Final project Note 1: The above weekly schedules are subject to change without further notice. Note 2: Laboratory sessions will be provided to strengthen practical hands-on skills.

評量方式

Attendance: 20% Homework + Classwork: 20% Mid-term exam or Mid-term project: 30% Final exam or Final project: 30%

教材

【遵守智慧財產權觀念，請使用正版教科書，不得使用非法影印教科書】 使用外文原文書：是 (1) Michael L. Bushnell and Vishwani D. Agrawal, "Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits," Kluwer Academic Publishers (2) Mark Burns and Gordon W. Roberts, "An Introduction to Mixed-Signal IC Test and Measurement", Oxford